{"dcterms:modified":"2025-07-15","dcterms:creator":"A Dataverse Instance","@type":"ore:ResourceMap","@id":"https://data.fz-juelich.de/api/datasets/export?exporter=OAI_ORE&persistentId=doi:10.26165/JUELICH-DATA/1HWSUA","ore:describes":{"fzj:Institute":"PGI-7","Title":"JART VCM Rth","fzj:PoF IV topic":"Memristive Materials and Devices (POF4-5233)","Author":[{"author:Name":"Menzel, Stephan","author:Affiliation":"Peter Grünberg Institut (PGI-7)"},{"author:Name":"Son, Seokki","author:Affiliation":"Peter Grünberg Institut (PGI-7)"},{"author:Name":"Schön, Daniel","author:Affiliation":"Peter Grünberg Institut (PGI-7)"}],"citation:Contact":{"datasetContact:Name":"Menzel, Stephan","datasetContact:Affiliation":"Peter Grünberg Institut (PGI-7)","datasetContact:E-mail":"st.menzel@fz-juelich.de"},"citation:Description":{"dsDescription:Text":"This model is an extension of the existing JART (Jülich Aachen Resistive Switching Tools) VCM v1b model, by incorporating state-dependent effective thermal resistance (Rth,eff) based on an electro-thermal continuum model. This enables precise modeling of multilevel behavior and includes the variability in switching cycles to reflect experimental conditions. Figure 1(JART_VCM_Rth_Fig1.jpg) shows that the validation with TaOx-based VCM devices co-integrated with 180 nm n-MOS transistors demonstrates the model’s accuracy, achieving consistent multilevel programming across 7-states and capturing cycle-to-cycle variability effectively. The Verilog-A code of this model and user guide can be downloaded."},"Subject":["Computer and Information Science","Engineering","Physics"],"citation:Depositor":"Schön, Daniel","Deposit Date":"2025-07-15","@id":"doi:10.26165/JUELICH-DATA/1HWSUA","@type":["ore:Aggregation","schema:Dataset"],"schema:version":"1.0","schema:datePublished":"2025-07-15","schema:name":"JART VCM Rth","schema:dateModified":"2025-07-15 08:04:50.17","schema:license":"https://creativecommons.org/publicdomain/zero/1.0/","dvcore:fileTermsOfAccess":{"dvcore:fileRequestAccess":false},"schema:includedInDataCatalog":"Peter Grünberg Institute (PGI) – Electronic Materials (PGI-7)","ore:aggregates":[{"schema:description":"This figure shows that the validation with TaOx-based VCM devices co-integrated with 180 nm n-MOS transistors demonstrates the model’s accuracy, achieving consistent multilevel programming across 7-states and capturing cycle-to-cycle variability effectively.","schema:name":"JART_VCM_Rth_Fig1.jpg","dvcore:restricted":false,"schema:version":1,"dvcore:datasetVersionId":871,"@id":"https://data.fz-juelich.de/file.xhtml?fileId=31870","schema:sameAs":"https://data.fz-juelich.de/api/access/datafile/31870","@type":"ore:AggregatedResource","schema:fileFormat":"image/jpeg","dvcore:filesize":69745,"dvcore:storageIdentifier":"s3://juelich_data:1980ccf9e64-7a162b690145","dvcore:rootDataFileId":-1,"dvcore:checksum":{"@type":"SHA-256","@value":"65cd826d38a25a0df684249a7e317762e001d3bfebaf625f930a0ea96ce53d14"}},{"schema:description":"The Verilog-A code of this model","schema:name":"JART VCM Rth veriloga.va","dvcore:restricted":false,"schema:version":1,"dvcore:datasetVersionId":871,"@id":"https://data.fz-juelich.de/file.xhtml?fileId=31871","schema:sameAs":"https://data.fz-juelich.de/api/access/datafile/31871","@type":"ore:AggregatedResource","schema:fileFormat":"application/octet-stream","dvcore:filesize":9594,"dvcore:storageIdentifier":"s3://juelich_data:1980ccf9ca2-f2a787ab0c43","dvcore:rootDataFileId":-1,"dvcore:checksum":{"@type":"SHA-256","@value":"52fced1bc167aa19129a3087e140814324a44a14753bd691a5645cc3bea5b98a"}}],"schema:hasPart":["https://data.fz-juelich.de/file.xhtml?fileId=31870","https://data.fz-juelich.de/file.xhtml?fileId=31871"]},"@context":{"Author":"http://purl.org/dc/terms/creator","Deposit Date":"http://purl.org/dc/terms/dateSubmitted","Subject":"http://purl.org/dc/terms/subject","Title":"http://purl.org/dc/terms/title","author":"https://dataverse.org/schema/citation/author#","citation":"https://dataverse.org/schema/citation/","datasetContact":"https://dataverse.org/schema/citation/datasetContact#","dcterms":"http://purl.org/dc/terms/","dsDescription":"https://dataverse.org/schema/citation/dsDescription#","dvcore":"https://dataverse.org/schema/core#","fzj":"https://jugit.fz-juelich.de/fdm/schemas","ore":"http://www.openarchives.org/ore/terms/","schema":"http://schema.org/"}}