<?xml version='1.0' encoding='UTF-8'?><metadata xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcterms="http://purl.org/dc/terms/" xmlns="http://dublincore.org/documents/dcmi-terms/"><dcterms:title>Fabrication and characterization of InAs nanowire-based quantum dot structures utilizing buried bottom gates</dcterms:title><dcterms:identifier>https://doi.org/10.26165/JUELICH-DATA/0X7H3S</dcterms:identifier><dcterms:creator>Schäpers, Thomas</dcterms:creator><dcterms:publisher>Jülich DATA</dcterms:publisher><dcterms:issued>2025-02-07</dcterms:issued><dcterms:modified>2025-02-07T12:26:22Z</dcterms:modified><dcterms:description>Semiconductor nanowires can be utilized to create quantum dot qubits. The formation of quantum dots is typically achieved by means of bottom gates created by a lift-off process. As an alternative, we fabricated flat buried bottom gate structures by filling etched trenches in a Si substrate with sputtered TiN, followed by mechanical polishing. This method achieved gate line pitches as small as 60 nm. The gate fingers have low gate leakage. As a proof of principle, we fabricated quantum dot devices using InAs nanowires placed on the gate fingers. These devices exhibit single electron tunneling and Coulomb blockade.</dcterms:description><dcterms:subject>Physics</dcterms:subject><dcterms:subject>buried gates</dcterms:subject><dcterms:subject>semiconductor nanowire</dcterms:subject><dcterms:subject>quantum dot</dcterms:subject><dcterms:isReferencedBy>arXiv, 2411.19575, https://doi.org/10.48550/arXiv.2411.19575</dcterms:isReferencedBy><dcterms:contributor>Schäpers, Thomas</dcterms:contributor><dcterms:dateSubmitted>2025-02-07</dcterms:dateSubmitted><dcterms:license>CC0</dcterms:license><dcterms:rights>CC0 Waiver</dcterms:rights></metadata>