Read noise variability in thermally oxidized Tantalum oxide-based ReRAM deviceshttps://doi.org/10.26165/JUELICH-DATA/BO2NPGSchnieders, KristofferStasner, PascalBai, PeixuanWouters, DirkWiefels, StefanJülich DATA2025-08-222025-10-30T09:26:03ZThis dataset contains raw and processed read noise measurements from thermally oxidized TaOx-based VCM devices, supporting the analysis presented in the associated APL publication. The raw data includes 1 s current readout traces recorded after resistive switching. The evaluation folder provides Python scripts used for data analysis and a pickled DataFrame with derived parameters.EngineeringPhysicsSchnieders, Kristoffer2025-08-18CCBY