<?xml version='1.0' encoding='UTF-8'?><metadata xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcterms="http://purl.org/dc/terms/" xmlns="http://dublincore.org/documents/dcmi-terms/"><dcterms:title>JART VCM v2</dcterms:title><dcterms:identifier>https://doi.org/10.26165/JUELICH-DATA/NFHTAR</dcterms:identifier><dcterms:creator>Menzel, Stephan</dcterms:creator><dcterms:creator>Bengel, Christopher</dcterms:creator><dcterms:publisher>Jülich DATA</dcterms:publisher><dcterms:issued>2025-03-25</dcterms:issued><dcterms:modified>2025-03-25T09:37:14Z</dcterms:modified><dcterms:description>The JARV VCM v2 model is an extension of the JART VCM v1 model. It includes two different switching locations I and II (see JART VCM v2.jpg). Thus, the model uses two state variables. In addition, diffusion between region I and II is included in this model, enabling the simulation of retention. The model was developed to simulate complementary switching and bipolar switching in a single device [1].</dcterms:description><dcterms:subject>Computer and Information Science</dcterms:subject><dcterms:subject>Engineering</dcterms:subject><dcterms:isReferencedBy>[1] C. La Torre, A. F. Zurhelle, T. Breuer, R. Waser and S. Menzel, Compact Modeling of Complementary Switching in Oxide-Based ReRAM Devices, IEEE Trans. Electron Devices 66, 1268-1275 (2019)., doi, https://doi.org/10.1109/TED.2019.2892997, https://doi.org/10.1109/TED.2019.2892997</dcterms:isReferencedBy><dcterms:contributor>Zhao, Xinyi</dcterms:contributor><dcterms:dateSubmitted>2025-01-30</dcterms:dateSubmitted><dcterms:license>CC0</dcterms:license><dcterms:rights>CC0 Waiver</dcterms:rights></metadata>