Data used in: Controlling the electronic and physical coupling on dielectric thin filmshttps://doi.org/10.26165/JUELICH-DATA/ZEA4SVPhilipp HurdaxMichael HollererLarissa EggerGeorg KollerXiaosheng YangAnja HaagsSerguei SoubatchF. Stefan TautzMathias RichterAlexander GottwaldPeter PuschnigMartin SterrerMichael G. RamseyJülich DATA2021-02-102025-02-06T10:15:37ZWe provide here the raw data used to produce the figures in the publication<br> Philipp Hurdax <i>et al.,</i> <br>Controlling the electronic and physical coupling on dielectric thin films, <br> Beilstein J. Nanotechnol. 2020, <b>11</b>, 1492–1503, <a href="https://doi.org/10.3762/bjnano.11.132">doi: 10.3762/bjnano.11.132</a> <br><br> All metadata necessary to analyze the data are contained in the files. <br> <b>12612-Ag(100)--35Pe---Fermi.txt</b> Angle-resolved photoemission spectroscopy data as acquired, used to produce figure 3a. <br> <b>12613-Ag(100)--35Pe---Fermi.txt</b> Angle-resolved photoemission spectroscopy data as acquired, used to produce figure 3b. <br> <br> Analysis program compatible with the format of these files can be requested from s.subach@fz-juelich.de.ChemistryPhysicsphotoemission tomographyangle-resolved photoelectron spectroscopypara-sexiphenylPhilipp Hurdax, Michael Hollerer, Larissa Egger, Georg Koller, Xiaosheng Yang, Anja Haags, Serguei Soubatch, Frank Stefan Tautz, Mathias Richter, Alexander Gottwald, Peter Puschnig, Martin Sterrer, and Michael G. Ramsey,<br /> Controlling the electronic and physical coupling on dielectric thin films, <br /> Beilstein J. Nanotechnol. 2020, <b>11</b>, 1492–1503, doi, 10.3762/bjnano.11.132, https://doi.org/10.3762/bjnano.11.132Subach, Sergey2021-02-09CCBY