Data used in: Solving the Phase Problem of Diffraction: X-ray Standing Wave Imaging on Bismuthene/SiC(0001)https://doi.org/10.26165/JUELICH-DATA/ZJVFIPKumpf, ChristianJülich DATA2025-11-032025-11-03T07:21:43ZWe provide here the raw data used to produce Figures in Niclas Tilgner, Susanne Wolff, Serguei Soubatch, Tien-Lin Lee, Fabian Göhler, F. Stefan Tautz, Thomas Seyller, Philip Schädlich, and Christian Kumpf, "Solving the Phase Problem of Diffraction: X-ray Standing Wave Imaging on Bismuthene/SiC(0001)" 2D MaterialsPhysicsNiclas Tilgner, Susanne Wolff, Serguei Soubatch, Tien-Lin Lee, Fabian Göhler, F. Stefan Tautz, Thomas Seyller, Philip Schädlich, and Christian Kumpf, "Solving the Phase Problem of Diffraction: X-ray Standing Wave Imaging on Bismuthene/SiC(0001)" 2D Materials, doiKumpf, Christian2025-10-02CCBY