Replication Data for: Single in-situ interface characterization composed of niobium and a selectively grown (Bi1-xSbx)2Te3 topological insulator nanoribbondoi:10.26165/JUELICH-DATA/47PXBGJülich DATA2024-04-301Janßen, Kevin; Rüßmann, Philipp; Liberda, Sergej; Schleenvoigt, Michael; Hou, Xiao; Jalil, Abdur Rehman; Lentz, Florian; Trellenkamp, Stefan; Bennemann, Benjamin; Zimmermann, Erik; Mussler, Gregor; Schüffelgen, Peter; Schneider, Claus-Michael; Blügel, Stefan; Grützmacher, Detlev; Plucinski, Lukasz; Schäpers, Thomas, 2024, "Replication Data for: Single in-situ interface characterization composed of niobium and a selectively grown (Bi1-xSbx)2Te3 topological insulator nanoribbon", https://doi.org/10.26165/JUELICH-DATA/47PXBG, Jülich DATA, V1Replication Data for: Single in-situ interface characterization composed of niobium and a selectively grown (Bi1-xSbx)2Te3 topological insulator nanoribbondoi:10.26165/JUELICH-DATA/47PXBGJanßen, KevinRüßmann, PhilippLiberda, SergejSchleenvoigt, MichaelHou, XiaoJalil, Abdur RehmanLentz, FlorianTrellenkamp, StefanBennemann, BenjaminZimmermann, ErikMussler, GregorSchüffelgen, PeterSchneider, Claus-MichaelBlügel, StefanGrützmacher, DetlevPlucinski, LukaszSchäpers, ThomasJülich DATARüßmann, PhilippRüßmann, Philipp2024-04-29Physicssuperconductivitytopological materialstopological superconductorMajoranatransportexperimenttheorydensity-functional theoryDFTWith increasing interest in Majorana physics for possible quantum bit applications, a large interest has been developed to understand the properties of the interface between a s-type superconductor and a topological insulator. Up to this point the interface analysis was mainly focused on in-situ prepared Josephson junctions, which consist of two coupled single interfaces or to ex-situ fabricated single interface devices. In our work we utilize a novel fabrication process, combining selective area growth and shadow evaporation which allows the characterization of a single in-situ fabricated Nb/(Bi0.15Sb0.85)2Te3 nano interface. The resulting high interface transparency, is apparent by a zero bias conductance increase by a factor of 1.7. Furthermore, we present a comprehensive differential conductance analysis of our single in-situ interface for various magnetic fields, temperatures and gate voltages. Additionally, density functional theory calculations of the superconductor/topological insulator interface are performed in order to explain the peak-like shape of our differential conductance spectra and the origin of the observed smearing of conductance features.CC0 Waiver10.24435/materialscloud:gt-0rKevin Janßen, Philipp Rüßmann, Sergej Liberda, Michael Schleenvoigt, Xiao Hou, Abdur Rehman Jalil, Florian Lentz, Stefan Trellenkamp, Benjamin Bennemann, Erik Zimmermann, Gregor Mussler, Peter Schüffelgen, Claus-Michael Schneider, Stefan Blügel, Detlev Grützmacher, Lukasz Plucinski, Thomas Schäpers, Single in-situ interface characterization composed of niobium and a selectively grown (Bi1-xSbx)2Te3 topological insulator nanoribbon, Materials Cloud Archive 2023.142 (2023)