Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devicesdoi:10.26165/JUELICH-DATA/BO2NPGJülich DATA2025-08-222Schnieders, Kristoffer; Stasner, Pascal; Bai, Peixuan; Wouters, Dirk; Wiefels, Stefan, 2025, "Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices", https://doi.org/10.26165/JUELICH-DATA/BO2NPG, Jülich DATA, V2Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devicesdoi:10.26165/JUELICH-DATA/BO2NPGSchnieders, KristofferStasner, PascalBai, PeixuanWouters, DirkWiefels, Stefan16ME0398K16ME0399Jülich DATASchnieders, KristofferWiefels, StefanSchnieders, Kristoffer2025-08-18EngineeringPhysicsThis dataset contains raw and processed read noise measurements from thermally oxidized TaOx-based VCM devices, supporting the analysis presented in the associated APL publication. The raw data includes 1 s current readout traces recorded after resistive switching. The evaluation folder provides Python scripts used for data analysis and a pickled DataFrame with derived parameters.data_readnoise_sample_A_and_B.pklapplication/octet-streamdata_readnoise_sample_C.pklapplication/octet-streamEG_TO_16.zipapplication/zipEG_TO_23.zipapplication/zipEG_TO_25.zipapplication/zipFunctions_datahandle.pytext/x-pythonReadMe.txttext/plainStore_data.pytext/x-python