Replication Data for: Boron nitride on SiC(0001)doi:10.26165/JUELICH-DATA/EIH8FBJülich DATA2022-02-242François C. Bocquet; Volker Blum; You-Ron Lin; Markus Franke; Shayan Parhizkar; Serguei Soubatch; Tien-Lin Lee; Miriam Raths; Victor Wen-zhe Yu; F. Stefan Tautz; Christian Kumpf, 2022, "Replication Data for: Boron nitride on SiC(0001)", https://doi.org/10.26165/JUELICH-DATA/EIH8FB, Jülich DATA, V2Replication Data for: Boron nitride on SiC(0001)doi:10.26165/JUELICH-DATA/EIH8FBFrançois C. BocquetVolker BlumYou-Ron LinMarkus FrankeShayan ParhizkarSerguei SoubatchTien-Lin LeeMiriam RathsVictor Wen-zhe YuF. Stefan TautzChristian KumpfJülich DATABocquet, François C.Bocquet, François C.2022-02-23Physics<p><strong>Fig. 3:</strong><br />correlation temperature-position:<br />position in mm: 21/22/23/24/25/26/27<br />temperatures in °C: 1100/1125/1150/1175/1200/1225/1250</p>
<p><strong>Fig. 4:</strong><br />Nova: 1100°C<br />Lami: 1150°C</p>
<p>*.csv: Line-scan on the B<em>x</em>N<em>y-R</em>0° peak</p>
<p>*.asc: Line-scan on the SiC peak</p>
<p><strong>Fig. 5:</strong><br />Lars: 1150°C<br />Jane: 1250°C<br />.txt: Single core-level<br />Fit_result_refl.dat: Best fit of the reflectivity<br />Exp_refl_norm_centered.dat: Experimental reflecticity curve<br />Fit_ey_*[n].dat: Best fit of the yield curve for component $n$<br />Exp_ey_*[n].dat: Experimental yield curve for component $n$</p>
<p><strong>Fig. 6:</strong><br />Lars: 1150°C<br />Jane_Argang_Gr-side_*: 1250°C<br />Jane_Argand_LowTempside_*: 1100°C</p>
<p><strong>Fig. 11:</strong><br />*.png: As prepared<br />*.tif: After air expose</p>
<p>For the simulations data see: <a href="https://dx.doi.org/10.17172/NOMAD/2022.02.24-1">https://dx.doi.org/10.17172/NOMAD/2022.02.24-1</a></p>10.1103/PhysRevMaterials.6.064002Phys. Rev. Materials 6, 064002 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