<?xml version='1.0' encoding='UTF-8'?><codeBook xmlns="ddi:codebook:2_5" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="ddi:codebook:2_5 https://ddialliance.org/Specification/DDI-Codebook/2.5/XMLSchema/codebook.xsd" version="2.5"><docDscr><citation><titlStmt><titl>JART VCM v1b var</titl><IDNo agency="DOI">doi:10.26165/JUELICH-DATA/FERGKU</IDNo></titlStmt><distStmt><distrbtr source="archive">Jülich DATA</distrbtr><distDate>2025-03-25</distDate></distStmt><verStmt source="DVN"><version date="2025-03-25" type="RELEASED">1</version></verStmt><biblCit>Menzel, Stephan; Bengel, Christopher, 2025, "JART VCM v1b var", https://doi.org/10.26165/JUELICH-DATA/FERGKU, Jülich DATA, V1</biblCit></citation></docDscr><stdyDscr><citation><titlStmt><titl>JART VCM v1b var</titl><IDNo agency="DOI">doi:10.26165/JUELICH-DATA/FERGKU</IDNo></titlStmt><rspStmt><AuthEnty affiliation="Peter Grünberg Institut (PGI-7)">Menzel, Stephan</AuthEnty><AuthEnty affiliation="RWTH Aachen University">Bengel, Christopher</AuthEnty></rspStmt><prodStmt/><distStmt><distrbtr source="archive">Jülich DATA</distrbtr><contact affiliation="Peter Grünberg Institut (PGI-7)" email="st.menzel@fz-juelich.de">Menzel, Stephan</contact><depositr>Bestaeva, Alana</depositr><depDate>2025-02-18</depDate></distStmt></citation><stdyInfo><subject><keyword>Engineering</keyword><keyword>Physics</keyword></subject><abstract>The JART VCM v1b var model represents an extension of the JART VCM v1b model which additionally considers device-to-device and cycle-to-cycle variability. The ECD can be seen in Fig. 1. The physical equations are the same as in the v1b model. Device-to-device variability is achieved through parameter variation of specific parameters during initialization of the devices and cycle-to-cycle variability is achieved through modification of the same parameters during the simulation run.</abstract><sumDscr/></stdyInfo><method><dataColl><sources/></dataColl><anlyInfo/></method><dataAccs><notes type="DVN:TOU" level="dv">CC0 Waiver</notes><setAvail/><useStmt/></dataAccs><othrStdyMat><relPubl><citation><titlStmt><IDNo agency="doi">https://doi.org/10.1109/TCSI.2020.3018502</IDNo></titlStmt><biblCit>C. Bengel, A. Siemon, F. Cüppers, S. Hoffmann-Eifert, A. Hardtdegen, M. von Witzleben, L. Hellmich, R. Waser and S. Menzel, Variability-Aware Modeling of Filamentary Oxide-Based Bipolar Resistive Switching Cells Using SPICE Level Compact Models, IEEE Trancsactions on Circuits and Systems-I, VOL. 67, NO. 12, 2020.</biblCit></citation><ExtLink URI="https://doi.org/10.1109/TCSI.2020.3018502"/></relPubl></othrStdyMat></stdyDscr><otherMat ID="f23484" URI="https://data.fz-juelich.de/api/access/datafile/23484" level="datafile"><labl>JART VCM1 compact model_Verilog-A_file.txt</labl><notes level="file" type="DATAVERSE:CONTENTTYPE" subject="Content/MIME Type">text/plain</notes></otherMat><otherMat ID="f23483" URI="https://data.fz-juelich.de/api/access/datafile/23483" level="datafile"><labl>User_Guide_for_the_JART_VCM_v1_Compact_Model.pdf</labl><notes level="file" type="DATAVERSE:CONTENTTYPE" subject="Content/MIME Type">application/pdf</notes></otherMat></codeBook>