<?xml version='1.0' encoding='UTF-8'?><codeBook xmlns="ddi:codebook:2_5" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="ddi:codebook:2_5 https://ddialliance.org/Specification/DDI-Codebook/2.5/XMLSchema/codebook.xsd" version="2.5"><docDscr><citation><titlStmt><titl>Replication Data for: Anisotropic dispersion of excitonic bands of the single-crystal pentacene (001) surface as measured by low-energy angle-resolved high-resolution electron energy-loss spectroscopy</titl><IDNo agency="DOI">doi:10.26165/JUELICH-DATA/WUFYPE</IDNo></titlStmt><distStmt><distrbtr source="archive">Jülich DATA</distrbtr><distDate>2025-01-15</distDate></distStmt><verStmt source="DVN"><version date="2025-01-16" type="RELEASED">1</version></verStmt><biblCit>Nakayama, Yasuo; Bocquet, François C.; Tsuruta, Ryohei; Soubatch, Serguei; Tautz, F. Stefan, 2025, "Replication Data for: Anisotropic dispersion of excitonic bands of the single-crystal pentacene (001) surface as measured by low-energy angle-resolved high-resolution electron energy-loss spectroscopy", https://doi.org/10.26165/JUELICH-DATA/WUFYPE, Jülich DATA, V1</biblCit></citation></docDscr><stdyDscr><citation><titlStmt><titl>Replication Data for: Anisotropic dispersion of excitonic bands of the single-crystal pentacene (001) surface as measured by low-energy angle-resolved high-resolution electron energy-loss spectroscopy</titl><IDNo agency="DOI">doi:10.26165/JUELICH-DATA/WUFYPE</IDNo></titlStmt><rspStmt><AuthEnty affiliation="Tokyo University of Science">Nakayama, Yasuo</AuthEnty><AuthEnty affiliation="Peter Grünberg Institut (PGI-3)">Bocquet, François C.</AuthEnty><AuthEnty affiliation="University of Tsukuba">Tsuruta, Ryohei</AuthEnty><AuthEnty affiliation="Peter Grünberg Institut (PGI-3)">Soubatch, Serguei</AuthEnty><AuthEnty affiliation="Peter Grünberg Institut (PGI-3)">Tautz, F. Stefan</AuthEnty></rspStmt><prodStmt/><distStmt><distrbtr source="archive">Jülich DATA</distrbtr><contact affiliation="Peter Grünberg Institut (PGI-3)" email="f.posseik@fz-juelich.de">Bocquet, François C.</contact><depositr>Bocquet, François C.</depositr><depDate>2025-01-15</depDate></distStmt></citation><stdyInfo><subject><keyword>Physics</keyword><keyword>Organic semiconductor</keyword><keyword>Single crystal</keyword><keyword>EELS</keyword><keyword>Exciton</keyword><keyword>Vibration</keyword></subject><abstract>*.txt files are ASCII files with angle-resolved high-resolution electron energy-loss spectroscopy data</abstract><sumDscr/></stdyInfo><method><dataColl><sources/></dataColl><anlyInfo/></method><dataAccs><setAvail/><useStmt/></dataAccs><othrStdyMat><relPubl><citation><biblCit>Journal of Electron Spectroscopy and Related Phenomena XXXXX (2025)</biblCit></citation></relPubl></othrStdyMat></stdyDscr><otherMat ID="f21503" URI="https://data.fz-juelich.de/api/access/datafile/21503" level="datafile"><labl>pn4_0017.txt</labl><txt>Angle-resolved high-resolution electron energy-loss spectroscopy data as acquired, used to produce energy distribution curves in Fig. 2.</txt><notes level="file" type="DATAVERSE:CONTENTTYPE" subject="Content/MIME Type">text/plain</notes></otherMat><otherMat ID="f21508" URI="https://data.fz-juelich.de/api/access/datafile/21508" level="datafile"><labl>pn4_0020.txt</labl><txt>Angle-resolved high-resolution electron energy-loss spectroscopy data as acquired, used to produce a specular beam spot image and its profiles in Figs. 1(b-d).</txt><notes level="file" type="DATAVERSE:CONTENTTYPE" subject="Content/MIME Type">text/plain</notes></otherMat><otherMat ID="f21506" URI="https://data.fz-juelich.de/api/access/datafile/21506" level="datafile"><labl>pn4_0021.txt</labl><txt>Angle-resolved high-resolution electron energy-loss spectroscopy data as acquired, used to produce energy distribution curves in Fig. 1(e).</txt><notes level="file" type="DATAVERSE:CONTENTTYPE" subject="Content/MIME Type">text/plain</notes></otherMat><otherMat ID="f21507" URI="https://data.fz-juelich.de/api/access/datafile/21507" level="datafile"><labl>pn4_0037.txt</labl><txt>Angle-resolved high-resolution electron energy-loss spectroscopy data as acquired, used to produce a spectral intensity map in Fig. 3(a).</txt><notes level="file" type="DATAVERSE:CONTENTTYPE" subject="Content/MIME Type">text/plain</notes></otherMat><otherMat ID="f21504" URI="https://data.fz-juelich.de/api/access/datafile/21504" level="datafile"><labl>pn4_0040.txt</labl><txt>Angle-resolved high-resolution electron energy-loss spectroscopy data as acquired, used to produce a spectral intensity map in Fig. 3(c).</txt><notes level="file" type="DATAVERSE:CONTENTTYPE" subject="Content/MIME Type">text/plain</notes></otherMat><otherMat ID="f21509" URI="https://data.fz-juelich.de/api/access/datafile/21509" level="datafile"><labl>pn4_0043.txt</labl><txt>Angle-resolved high-resolution electron energy-loss spectroscopy data as acquired, used to produce a spectral intensity map in Fig. 3(b).</txt><notes level="file" type="DATAVERSE:CONTENTTYPE" subject="Content/MIME Type">text/plain</notes></otherMat><otherMat ID="f21505" URI="https://data.fz-juelich.de/api/access/datafile/21505" level="datafile"><labl>pn4_0046.txt</labl><txt>Angle-resolved high-resolution electron energy-loss spectroscopy data as acquired, used to produce a spectral intensity map in Fig. 3(d).</txt><notes level="file" type="DATAVERSE:CONTENTTYPE" subject="Content/MIME Type">text/plain</notes></otherMat></codeBook>