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Part 1: Document Description
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Citation |
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Title: |
Replication Data for: Single in-situ interface characterization composed of niobium and a selectively grown (Bi1-xSbx)2Te3 topological insulator nanoribbon |
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Identification Number: |
doi:10.26165/JUELICH-DATA/47PXBG |
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Distributor: |
Jülich DATA |
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Date of Distribution: |
2024-04-30 |
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Version: |
1 |
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Bibliographic Citation: |
Janßen, Kevin; Rüßmann, Philipp; Liberda, Sergej; Schleenvoigt, Michael; Hou, Xiao; Jalil, Abdur Rehman; Lentz, Florian; Trellenkamp, Stefan; Bennemann, Benjamin; Zimmermann, Erik; Mussler, Gregor; Schüffelgen, Peter; Schneider, Claus-Michael; Blügel, Stefan; Grützmacher, Detlev; Plucinski, Lukasz; Schäpers, Thomas, 2024, "Replication Data for: Single in-situ interface characterization composed of niobium and a selectively grown (Bi1-xSbx)2Te3 topological insulator nanoribbon", https://doi.org/10.26165/JUELICH-DATA/47PXBG, Jülich DATA, V1 |
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Citation |
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Title: |
Replication Data for: Single in-situ interface characterization composed of niobium and a selectively grown (Bi1-xSbx)2Te3 topological insulator nanoribbon |
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Identification Number: |
doi:10.26165/JUELICH-DATA/47PXBG |
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Authoring Entity: |
Janßen, Kevin (PGI-6 / PGI-9) |
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Rüßmann, Philipp (PGI-1 / IAS-1) |
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Liberda, Sergej (PGI-9) |
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Schleenvoigt, Michael (PGI-9) |
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Hou, Xiao (PGI-9) |
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Jalil, Abdur Rehman (PGI-9) |
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Lentz, Florian (Helmholtz Nano Facility) |
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Trellenkamp, Stefan (Helmholtz Nano Facility) |
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Bennemann, Benjamin (PGI-9) |
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Zimmermann, Erik (PGI-9) |
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Mussler, Gregor (PGI-9) |
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Schüffelgen, Peter (PGI-9) |
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Schneider, Claus-Michael (PGI-6) |
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Blügel, Stefan (PGI-1 / IAS-1) |
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Grützmacher, Detlev (PGI-9) |
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Plucinski, Lukasz (PGI-6) |
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Schäpers, Thomas (PGI-9) |
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Distributor: |
Jülich DATA |
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Access Authority: |
Rüßmann, Philipp |
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Depositor: |
Rüßmann, Philipp |
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Date of Deposit: |
2024-04-29 |
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Study Scope |
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Keywords: |
Physics, superconductivity, topological materials, topological superconductor, Majorana, transport, experiment, theory, density-functional theory, DFT |
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Abstract: |
With increasing interest in Majorana physics for possible quantum bit applications, a large interest has been developed to understand the properties of the interface between a s-type superconductor and a topological insulator. Up to this point the interface analysis was mainly focused on in-situ prepared Josephson junctions, which consist of two coupled single interfaces or to ex-situ fabricated single interface devices. In our work we utilize a novel fabrication process, combining selective area growth and shadow evaporation which allows the characterization of a single in-situ fabricated Nb/(Bi0.15Sb0.85)2Te3 nano interface. The resulting high interface transparency, is apparent by a zero bias conductance increase by a factor of 1.7. Furthermore, we present a comprehensive differential conductance analysis of our single in-situ interface for various magnetic fields, temperatures and gate voltages. Additionally, density functional theory calculations of the superconductor/topological insulator interface are performed in order to explain the peak-like shape of our differential conductance spectra and the origin of the observed smearing of conductance features. |
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Methodology and Processing |
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Sources Statement |
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Data Access |
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Notes: |
CC0 Waiver |
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Other Study Description Materials |
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Related Publications |
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Citation |
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Identification Number: |
10.24435/materialscloud:gt-0r |
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Bibliographic Citation: |
Kevin Janßen, Philipp Rüßmann, Sergej Liberda, Michael Schleenvoigt, Xiao Hou, Abdur Rehman Jalil, Florian Lentz, Stefan Trellenkamp, Benjamin Bennemann, Erik Zimmermann, Gregor Mussler, Peter Schüffelgen, Claus-Michael Schneider, Stefan Blügel, Detlev Grützmacher, Lukasz Plucinski, Thomas Schäpers, Single in-situ interface characterization composed of niobium and a selectively grown (Bi1-xSbx)2Te3 topological insulator nanoribbon, Materials Cloud Archive 2023.142 (2023) |