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Part 1: Document Description
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Citation |
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Title: |
Data used in:Epitaxial growth of mono- and (twisted) multilayer graphene on SiC(0001) |
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Identification Number: |
doi:10.26165/JUELICH-DATA/F1JRQW |
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Distributor: |
Jülich DATA |
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Date of Distribution: |
2025-03-31 |
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Version: |
1 |
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Bibliographic Citation: |
Yin, Hao; Hutter, Mark; Wagner, Christian; Tautz, F. Stefan; Bocquet, François C.; Kumpf, Christian, 2025, "Data used in:Epitaxial growth of mono- and (twisted) multilayer graphene on SiC(0001)", https://doi.org/10.26165/JUELICH-DATA/F1JRQW, Jülich DATA, V1 |
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Citation |
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Title: |
Data used in:Epitaxial growth of mono- and (twisted) multilayer graphene on SiC(0001) |
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Identification Number: |
doi:10.26165/JUELICH-DATA/F1JRQW |
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Authoring Entity: |
Yin, Hao (PGI-3) |
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Hutter, Mark (PGI-3) |
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Wagner, Christian (PGI-3) |
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Tautz, F. Stefan (PGI-3) |
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Bocquet, François C. (PGI-3) |
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Kumpf, Christian (PGI-3) |
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Distributor: |
Jülich DATA |
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Access Authority: |
Kumpf, Christian |
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Depositor: |
Yin, Hao |
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Date of Deposit: |
2025-02-27 |
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Study Scope |
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Keywords: |
Physics, LEEM, 0-degree Rotated Epitaxial Graphene |
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Abstract: |
It contains the obtained raw data by low energy electron microscopy (LEEM), and Angle-resolved Photoemission Spectroscopy (ARPES). The data are stored in the type of TIF (.tiff), and each TIF file is an image-sequence of LEEM. |
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Methodology and Processing |
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Sources Statement |
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Data Access |
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Other Study Description Materials |
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Related Publications |
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Citation |
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Identification Number: |
arXiv:2411.11684 |
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Bibliographic Citation: |
Epitaxial growth of mono- and (twisted) multilayer graphene on SiC(0001) |
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Label: |
high_T_0grad_y0.ARPES-hdf |
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Notes: |
application/octet-stream |
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Label: |
high_T_30grad_y0.ARPES-hdf |
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Notes: |
application/octet-stream |
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Label: |
high_T_sample_DF-LEEM_55eV_00.tif |
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Notes: |
image/tiff |
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Label: |
high_T_sample_DF-LEEM_55eV_01.tif |
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Notes: |
image/tiff |
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Label: |
high_T_sample_DF-LEEM_55eV_02.tif |
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Notes: |
image/tiff |
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Label: |
high_T_sample_DF-LEEM_55eV_05.tif |
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Notes: |
image/tiff |
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Label: |
high_T_sample_DF-LEEM_55eV_06.tif |
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Notes: |
image/tiff |
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Label: |
high_T_sample_DF-LEEM_55eV_07.tif |
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Notes: |
image/tiff |
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Label: |
high_T_sample_DF-LEEM_55eV_08.tif |
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Notes: |
image/tiff |
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Label: |
high_T_sample_LEED_55eV.tif |
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Notes: |
image/tiff |
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Label: |
high_T_sample_LEEM-IV with CA_5mum.tif |
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Notes: |
image/tiff |
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Label: |
low_T_0grad_y0.ARPES-hdf |
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Notes: |
application/octet-stream |
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Label: |
low_T_30grad_y0.ARPES-hdf |
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Notes: |
application/octet-stream |
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Label: |
low_T_sample_DF-LEEM_55eV_00.tif |
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Notes: |
image/tiff |
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Label: |
low_T_sample_DF-LEEM_55eV_01.tif |
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Notes: |
image/tiff |
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Label: |
low_T_sample_DF-LEEM_55eV_02.tif |
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Notes: |
image/tiff |
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Label: |
low_T_sample_DF-LEEM_55eV_03.tif |
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Notes: |
image/tiff |
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Label: |
low_T_sample_DF-LEEM_55eV_04.tif |
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Notes: |
image/tiff |
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Label: |
low_T_sample_DF-LEEM_55eV_05.tif |
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Notes: |
image/tiff |
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Label: |
low_T_sample_DF-LEEM_55eV_06.tif |
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Notes: |
image/tiff |
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Label: |
low_T_sample_DF-LEEM_55eV_07.tif |
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Notes: |
image/tiff |
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Label: |
low_T_sample_DF-LEEM_55eV_08.tif |
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Notes: |
image/tiff |
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Label: |
low_T_sample_DF-LEEM_55eV_09.tif |
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Notes: |
image/tiff |
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Label: |
low_T_sample_DF-LEEM_55eV_10.tif |
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Notes: |
image/tiff |
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Label: |
low_T_sample_LEED_55eV.tif |
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Notes: |
image/tiff |
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Label: |
low_T_sample_LEEM-IV with CA_15mum.tif |
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Notes: |
image/tiff |