Replication Data for: Anisotropic dispersion of excitonic bands of the single-crystal pentacene (001) surface as measured by low-energy angle-resolved high-resolution electron energy-loss spectroscopy (ICPSR doi:10.26165/JUELICH-DATA/WUFYPE)

View:

Part 1: Document Description
Part 2: Study Description
Part 5: Other Study-Related Materials
Entire Codebook

Document Description
Citation
Title:	Replication Data for: Anisotropic dispersion of excitonic bands of the single-crystal pentacene (001) surface as measured by low-energy angle-resolved high-resolution electron energy-loss spectroscopy
Identification Number:	doi:10.26165/JUELICH-DATA/WUFYPE
Distributor:	Jülich DATA
Date of Distribution:	2025-01-15
Version:	1
Bibliographic Citation:	Nakayama, Yasuo; Bocquet, François C.; Tsuruta, Ryohei; Soubatch, Serguei; Tautz, F. Stefan, 2025, "Replication Data for: Anisotropic dispersion of excitonic bands of the single-crystal pentacene (001) surface as measured by low-energy angle-resolved high-resolution electron energy-loss spectroscopy", https://doi.org/10.26165/JUELICH-DATA/WUFYPE, Jülich DATA, V1
Study Description
Citation
Title:	Replication Data for: Anisotropic dispersion of excitonic bands of the single-crystal pentacene (001) surface as measured by low-energy angle-resolved high-resolution electron energy-loss spectroscopy
Identification Number:	doi:10.26165/JUELICH-DATA/WUFYPE
Authoring Entity:	Nakayama, Yasuo (Tokyo University of Science)
	Bocquet, François C. (Peter Grünberg Institut (PGI-3))
	Tsuruta, Ryohei (University of Tsukuba)
	Soubatch, Serguei (Peter Grünberg Institut (PGI-3))
	Tautz, F. Stefan (Peter Grünberg Institut (PGI-3))
Distributor:	Jülich DATA
Access Authority:	Bocquet, François C.
Depositor:	Bocquet, François C.
Date of Deposit:	2025-01-15
Study Scope
Keywords:	Physics, Organic semiconductor, Single crystal, EELS, Exciton, Vibration
Abstract:	*.txt files are ASCII files with angle-resolved high-resolution electron energy-loss spectroscopy data
Methodology and Processing
Sources Statement
Data Access
Other Study Description Materials
Related Publications
Citation
Bibliographic Citation:	Journal of Electron Spectroscopy and Related Phenomena XXXXX (2025)
Other Study-Related Materials
Label:	pn4_0017.txt
Text:	Angle-resolved high-resolution electron energy-loss spectroscopy data as acquired, used to produce energy distribution curves in Fig. 2.
Notes:	text/plain
Other Study-Related Materials
Label:	pn4_0020.txt
Text:	Angle-resolved high-resolution electron energy-loss spectroscopy data as acquired, used to produce a specular beam spot image and its profiles in Figs. 1(b-d).
Notes:	text/plain
Other Study-Related Materials
Label:	pn4_0021.txt
Text:	Angle-resolved high-resolution electron energy-loss spectroscopy data as acquired, used to produce energy distribution curves in Fig. 1(e).
Notes:	text/plain
Other Study-Related Materials
Label:	pn4_0037.txt
Text:	Angle-resolved high-resolution electron energy-loss spectroscopy data as acquired, used to produce a spectral intensity map in Fig. 3(a).
Notes:	text/plain
Other Study-Related Materials
Label:	pn4_0040.txt
Text:	Angle-resolved high-resolution electron energy-loss spectroscopy data as acquired, used to produce a spectral intensity map in Fig. 3(c).
Notes:	text/plain
Other Study-Related Materials
Label:	pn4_0043.txt
Text:	Angle-resolved high-resolution electron energy-loss spectroscopy data as acquired, used to produce a spectral intensity map in Fig. 3(b).
Notes:	text/plain
Other Study-Related Materials
Label:	pn4_0046.txt
Text:	Angle-resolved high-resolution electron energy-loss spectroscopy data as acquired, used to produce a spectral intensity map in Fig. 3(d).
Notes:	text/plain