10.26165/JUELICH-DATA/F1JRQWYin, HaoHaoYin0000-0002-7092-516XPGI-3Hutter, MarkMarkHutter0000-0001-9849-0893PGI-3Wagner, ChristianChristianWagner0000-0002-2117-6289PGI-3Tautz, F. StefanF. StefanTautz0000-0003-3583-2379PGI-3Bocquet, François C.François C.Bocquet0000-0002-9471-4439PGI-3Kumpf, ChristianChristianKumpf0000-0003-3567-5377PGI-3Data used in:Epitaxial growth of mono- and (twisted) multilayer graphene on SiC(0001)Jülich DATA2025PhysicsLEEM0-degree Rotated Epitaxial GrapheneKumpf, ChristianChristianKumpfPGI-32025-02-272025-03-31arXiv:2411.116841383416138341615733492188801682097795221502398209779522097795220977952157334931311101151273976127397620977952220268442255129026222411262224112622241227271304262224123566244026746858262224122307573752968555application/octet-streamapplication/octet-streamimage/tiffimage/tiffimage/tiffimage/tiffimage/tiffimage/tiffimage/tiffimage/tiffimage/tiffapplication/octet-streamapplication/octet-streamimage/tiffimage/tiffimage/tiffimage/tiffimage/tiffimage/tiffimage/tiffimage/tiffimage/tiffimage/tiffimage/tiffimage/tiffimage/tiff1.0It contains the obtained raw data by low energy electron microscopy (LEEM), and Angle-resolved Photoemission Spectroscopy (ARPES).
The data are stored in the type of TIF (.tiff), and each TIF file is an image-sequence of LEEM.